| SOFT - TIAFT 1998 | Scientific Session 7 | Friday October 9, 1998 |
| APPLICATION OF SURFACE IONIZATION ORGANIC MASS SPECTROMETRY (SIOMS) TO FORENSIC TOXICOLOGY: IDENTIFICATION AND HIGHLY SENSITIVE QUANTITATION OF PHENCYCLIDINE (PCP) IN HUMAN BODY FLUIDS | |
| Picture not available |
Akira Ishii, Hiroshi Seno, Kanako Watanabe-Suzuki, Takeshi Kumazawa* and Osamu Suzuki
Department of Legal Medicine, Hamamatsu University School of Medicine, 3600 Handa-cho, Hamamatsu 431-3192, Japan |
| Surface ionization (SI), an ionization of organic compounds on an incandescent metal surface, has been used for detection of drugs and toxic compounds by gas chromatography (GC). SI specifically ionizes tertiary amines; thus this method is very useful for analysis of abused drugs containing tertiary amines. Recently, Fujii and Arimoto have developed new surface ionization organic mass spectrometry techniques (SIOMS), based on the SI principle. In this study, we have applied the SIOMS to analysis of phencyclidine (PCP) in human body fluids.
A quadrupole GC/MS system of QP 5050A with a GC-17A gas chromatograph (Shimadzu) was used. A rhenium ribbon filament was placed on the tip of a direct inlet probe. The filament was heated resistively, and continuous oxygen introduction was employed to keep the condition of the surface constant. We spiked 25 ng each of PCP and pethidine (internal standard, IS) into 1 mL of human body fluids and extracted by solid-phase extraction using Bond Elut glass cartridges before SIOMS analyses. We compared the peaks of PCP and IS obtained by SIOMS with those obtained by the conventional electron impact (EI) MS. When 500 pg each of PCP and IS was injected, SIOMS gave sharp peaks in total ion chromatograms, while such peaks were hardly detectable in the EI mode. A calibration curve for PCP obtained from mass chromatograms by SIOMS was linear in the range of 5 to 200 pg on-column. Because of its high sensitivity and high specificity, this method seems quite promising for forensic toxicology. |
 Previous Abstract |
Friday Index |
 Next Abstract |
Further information: tiaft98@aol.com or spiehleraa@aol.com
TIAFT & CBFT 1995 - 1997 All Rights Reserved